Automotive Transient Immunity Generators

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Teseq NSG 5500-1 Automotive Transient Immunity Tests ISO 7637 up to Three Transient Modules View larger

Teseq NSG 5500-1 Automotive Transient Immunity Tests ISO 7637 up to Three Transient Modules

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  • MT 5511 Micro Transients
  • FT 5531 Fast Transients
  • LD 5550 Load Dump Generator
  • Built-in 100 A coupler/battery switch
  • Contains space for up to three transient modules
  • Supports USB and GPIB

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Specifications

Supply Voltage100 – 120 VAC ±10%, 47 – 63 Hz 20 – 240 VAC ±10%, 47 – 63 Hz
Mains & EUT ConnectionsIntegrated 100A CDN From an external source, e.g. battery or PA 5840 power amplifier/battery simulator
Electrical Fast Transients
EFT/Burst module for test pulses 3A/3B
ParameterValue
Test Voltage50 – 800 V
Rise time5 ns (±30%)
Pulse duration150 ns (±20%) 100 ns (±10%)
VerificationISO 7637-2
Source Impedance50ohm
PolarityPositive/negative
Trigger of burstsAutomatic, manual, external
Burst duration0.01 to 99.9 ms
Repetition rate90 ms – 99.9 s in 10 ms steps
Spike frequency1 – 100 kHz in 0.1 kHz steps
Test duration99.9 s
Micropulse
Micropulse module for test pulses 1, 2A and 6
ParameterValue
Test voltage20V - 600V ± 10% (peak voltage and polarity as per selected standard)
Repetition rate0.5–60 (0.1 steps)
AS PER ISO 7637-2 THE FOLLOWING STANDARDS CAN BE COVEREDSAE J1113, GM 3097, BMW, Volkswagen, PSA, Chrysler, DC 10614, Renault, FIAT, Mitsubishi, Honda, Ford ES-XW7T,
Triggerautomatic, manual, external
General Data
Technical Details
ParameterValue
Dimensions19” desktop housing (rack mountable), height 330 mm (13”), depth 510 mm 20”)

Test Equipment Description

Teseq NSG 5500-1 Description:

The Teseq NSG 5500-1 automotive EMC solution offers the generators necessary for tests with capacitive discharge pulsed interference as called for by ISO, SAE, DIN and JASO, and others.

The Teseq NSG 5500-1 is configured for one load dump module and two transient modules. The option for two load dump modules and up to three transient modules is available in the Teseq NSG 5500-2

All NSG 5500 generators are calibrated in accordance with ISO 7637-2:2011, ISO 16750-2:2010
or manufacturer-specific standards.

Teseq NSG 5500-2 Test Standards:

Teseq NSG 5500-1 Standard Configuration:

MT5511 Power Entry module  for 1,2 6 and GM pulses 7a/7b
  • Switching actions with inductive and other loads influenced by complex inductances of the wiring harness all create disturbances that must be simulated. ISO and SAE have defined these tests as pulse 1, 2a and 6. The MT 5511 produces these test pulses in conformance with the relevant standard

FT 5531 EFT generator for 3a/3b and variants

  • The Teseq FT 5531 simulates fast transient interference injected onto a vehicle’s electrical network through switching processes influenced by the wiring harness that can affect the correct operation of electronic units. The FT 5531 simulates EFT bursts with pulse widths of 100 or 150 ns in conformance with the standards for pulse 3a/3b interference phenomena.

LD 5550 Load dump generator

  • Pulses 5a, 5b, and 7 and manufacturer/international standards 40 – 1500 ms pulse 5, 5b

Teseq NSG 5500-1 Includes:

  • CDN 5500 built-in 100 amp coupler
  • Autorstar Software
  • RS232 Interface
  • IEEE Interface
  • HV Supply
  • Processor
  • Calibration Certificate

Adjustable Parameters of the Teseq NSG 5500-1:

LD 5550

  • Pulse amplitude 20 – 200 V in 0.1 V steps
  • Clamping 10 – 100 V
  • Impedance (Ri ) 0.5 – 10 Ω in 0.25 Ω steps; 30.5 Ω, 40 Ω
  • Pulse rise time 0.09 to 10 ms Pulse 5b overshoot typ. <2%
  • Pulse duration 30 – 1500 ms in 1 ms steps
  • Pulse repetition 15 – 600 s in 0.1 s steps, pulse repetition depends on pulse energy
  • Pulse modes Single, continuous, programmed 1 to 9,999

FT 5531

  • Pulse amplitude 50 – 800 V (±10%) 50 – 600 V (±10%) 50 – 600 V (±10%) 50 – 600 V (±15%)
  • Impedance 50 Ω
  • Pulse rise time 5 ns (±30%)
  • Pulse width 150 ns (±20%) 100 ns (±10%)
  • Burst frequency 1 – 100 kHz in 0.1 kHz steps
  • Burst interval 0.01 to 99.9 ms
  • Pulses per burst 1 – 200
  • Burst repetition 90 ms – 99.9 s in 10 ms steps
  • Pulse modes Single, continuous, programmed

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