Surge, Burst/EFT, Ring Wave, Dips & Interrupts

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Teseq NSG 3040-IEC Test System for Surge Combination Wave, EFT/Burst, Dips Interrupts & Variations w/ Single Phase 16 A CDN View larger

Teseq NSG 3040-IEC Test System for Surge Combination Wave, EFT/Burst, Dips Interrupts & Variations w/ 16 A CDN

Used

  • Rent the Teseq NSG 3040-IEC System
  • Includes PQM 3403 module to perform interrupt tests
  • Fully IEC 61000-4-2, -4, -5 compliant
  • Fully IEC 61000-4-11 & -4-29 compliant
  • 16 A single phase CDN
  • Multi-function generator for immunity testing in compliance with EN/IEC 61000-4-4,5,11,29 for single phase testing up to 270 V/16 A.
  • Up to 4.4kV Surge and 4.8kV EFT/Burst testing

More details

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Specifications

Supply Voltage 85 to 265 VAC, 50 / 60 Hz
Pulse voltage (open circuit) ±200 V to 4.4 kV (in 1 V steps)
Impedance 2/12 Ω
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
Parameter Value
Pulse current (short circuit) ±100 A to 2.2 kA
Coupling Integrated single phase CDN: 264 V AC / 16 A, 220 V DC / 10 A
Pulse repetition 10 s, up to 600 s (in 1 s steps)
Polarity pos / neg / alternate
Phase synchronization asynchronous, synchronous 0 to 359º (in 1º steps)
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter Value
Dips, Interrupts & Variations From EUT voltage input to 0 V, 0%
Test duration 1 s to 70’000 min, 1 to 99’999 events, continuous
Uvar with step transformer depending on model (VAR 650x) 0, 40, 70, 80% (INA 650x)
Test duration 1 to 9999 pulses, continuous
Peak inrush current capability 500 A (at 230 V)
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter Value
Pulse amplitude ±200 V to 4.8 kV (in 1 V steps) - open circuit ±100 V to 2.4 kV (50 Ω matching system)
Burst frequency 100 Hz to 1000 kHz
Polarity positive / negative / alternate
Counter unlimited
Internal Data Memory unlimited
Dimensions 449 (17.7”) x 226 (8.9”; 5 HU) x 565 mm (22.2”) (W x H x D)
Weight approx. 29 kg (64 lbs)
Display Interface 7“ touch-screen
USB Input Yes

Test Equipment Description

Teseq NSG 3040-IEC Description:

The Teseq NSG 3040 multifunction generator for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Teseq NSG 3040-IEC Video Overview

Used Teseq NSG-3040-IEC Includes:

  • NSG 3040 Generator
  • User Manual
  • 1 Mains Power Cable
  • 1 Dummy Plug (interlock connector)
  • 1 Grounding Strip 10cm
  • 1 EUT Power Input Connector with Cable
  • 1 EUT Power Output Connector
  • Fresh Calibration w/ Data
  • 10% off Calibration Service for Life

Standards Met:

EN/IEC 61000-4-4

EN/IEC 61000-4-5

EN/IEC 61000-4-11

EN/IEC 61000-4-29

 

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