Automotive Transient Immunity Generators

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Teseq NSG 5500-1 Automotive Transient Immunity Tests ISO 7637 Pulses 1, 2a, 3a, 3b up to Three Transient Modules View larger

Used Teseq NSG 5500-1 Automotive Test System

Used

  • MT 5511 Micro Transients
  • FT 5531 Fast Transients
  • LD 5550 Load Dump Generator
  • Autostar 7 software
  • Built-in 100 A coupler/battery switch
  • CDN 5500
  • Contains space for up to three transient modules
  • Supports USB and GPIB
  • Meets ISO 7637-2ISO 16750-2 and more

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Specifications

Supply Voltage 100 – 120 VAC ±10%, 47 – 63 Hz 20 – 240 VAC ±10%, 47 – 63 Hz
Mains & EUT Connections Integrated 100A CDN From an external source, e.g. battery or PA 5840 power amplifier/battery simulator
Electrical Fast Transients
EFT/Burst module for test pulses 3A/3B
Parameter Value
Test Voltage 50 – 800 V
Rise time 5 ns (±30%)
Pulse duration 150 ns (±20%) 100 ns (±10%)
Verification ISO 7637-2
Source Impedance 50ohm
Polarity Positive/negative
Trigger of bursts Automatic, manual, external
Burst duration 0.01 to 99.9 ms
Repetition rate 90 ms – 99.9 s in 10 ms steps
Spike frequency 1 – 100 kHz in 0.1 kHz steps
Test duration 99.9 s
Micropulse
Micropulse module for test pulses 1, 2A and 6
Parameter Value
Test voltage 20V - 600V ± 10% (peak voltage and polarity as per selected standard)
Repetition rate 0.5–60 (0.1 steps)
AS PER ISO 7637-2 THE FOLLOWING STANDARDS CAN BE COVERED SAE J1113, GM 3097, BMW, Volkswagen, PSA, Chrysler, DC 10614, Renault, FIAT, Mitsubishi, Honda, Ford ES-XW7T,
Trigger automatic, manual, external
General Data
Technical Details
Parameter Value
Dimensions 19” desktop housing (rack mountable), height 330 mm (13”), depth 510 mm 20”)

Test Equipment Description

Teseq NSG 5500-1 Description:

The Teseq NSG 5500-1 automotive EMC solution offers the generators necessary for tests with capacitive discharge pulsed interference as called for by ISO, SAE, DIN and JASO, and others.

The Teseq NSG 5500-1 is configured for one load dump module and two transient modules. The option for two load dump modules and up to three transient modules is available in the Teseq NSG 5500-2

All NSG 5500 generators are calibrated in accordance with ISO 7637-2:2011, ISO 16750-2:2010
or manufacturer-specific standards.

Teseq NSG 5500-1 Standard configuration:

MT5511 Power Entry module  for 1,2 6 and GM pulses 7a/7b
  • Switching actions with inductive and other loads influenced by complex inductances of the wiring harness all create disturbances that must be simulated. ISO and SAE have defined these tests as pulse 1, 2a and 6. The MT 5511 produces these test pulses in conformance with the relevant standard

FT 5531 EFT generator for 3a/3b and variants

  • The Teseq FT 5531 simulates fast transient interference injected onto a vehicle’s electrical network through switching processes influenced by the wiring harness that can affect the correct operation of electronic units. The FT 5531 simulates EFT bursts with pulse widths of 100 or 150 ns in conformance with the standards for pulse 3a/3b interference phenomena.

LD 5550 Load dump generator

  • Pulses 5a, 5b, and 7 and manufacturer/international standards 40 – 1500 ms pulse 5, 5b

Teseq NSG 5500-1 Includes:

  • CDN 5500 built-in 100 amp coupler
  • Autorstar Software
  • RS232 Interface
  • IEEE Interface
  • HV Supply
  • Processor
  • Calibration Certificate
  • 10% off Calibration Service for Life

Adjustable Parameters of the Teseq NSG 5500-1:

LD 5550

  • Pulse amplitude 20 – 200 V in 0.1 V steps
  • Clamping 10 – 100 V
  • Impedance (Ri ) 0.5 – 10 Ω in 0.25 Ω steps; 30.5 Ω, 40 Ω
  • Pulse rise time 0.09 to 10 ms Pulse 5b overshoot typ. <2%
  • Pulse duration 30 – 1500 ms in 1 ms steps
  • Pulse repetition 15 – 600 s in 0.1 s steps, pulse repetition depends on pulse energy
  • Pulse modes Single, continuous, programmed 1 to 9,999

FT 5531

  • Pulse amplitude 50 – 800 V (±10%) 50 – 600 V (±10%) 50 – 600 V (±10%) 50 – 600 V (±15%)
  • Impedance 50 Ω
  • Pulse rise time 5 ns (±30%)
  • Pulse width 150 ns (±20%) 100 ns (±10%)
  • Burst frequency 1 – 100 kHz in 0.1 kHz steps
  • Burst interval 0.01 to 99.9 ms
  • Pulses per burst 1 – 200
  • Burst repetition 90 ms – 99.9 s in 10 ms steps
  • Pulse modes Single, continuous, programmed

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