Rent, buy or lease Electromagnetic Side-Channel Analysis (EM-SCA) Test Equipment for integrated circuit (IC) security pre-certification testing.
EM-SCA is a passive, non-invasive technique that does not inject faults but instead measures and analyzes the IC's unintentional EM radiation to infer sensitive information, such as cryptographic keys.
Analysis techniques:
Differential EM Analysis (DEMA): This advanced technique uses statistical methods to compare the EM emissions from multiple operations. By analyzing the tiny differences in radiation patterns, an attacker can identify correlations with secret data.
Simple EM Analysis (SEMA): In some cases, a single EM trace from a cryptographic operation can be enough to expose information without statistical analysis.
Near-Field vs. Far-Field: Testing can be performed at a close range (near-field) using a microprobe for high spatial resolution or at a distance (far-field) for lower-precision analysis.
Methodology:
A test setup involves placing a near-field EM probe close to the IC to measure its radiating electric (E-field) and magnetic (H-field) signals.
During test operations, emissions are recorded with a high-bandwidth oscilloscope or spectrum analyzer.
Specialized software then processes and analyzes the captured EM traces to identify potential information leakage.
