AH Systems RF Current Injection Probes
AH Systems Current Probes are devices used in a wide variety of industrial and scientific applications, and designed to be used in the process of generating and measuring high levels of RF current. Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes. These EMC Current Probes are designed to permit field intensity meters, spectrum analyzers, and other 50 ohm impedance instruments to measure quantitative magnitudes of current. Measurements can be made on single and multi-conductor cables, ground and bonding straps, shielded conduits and on coaxial cables.